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Semiconductor Wafer-Sort Yield Data Analysis

A Python-based data analysis project demonstrating a complete product-engineering workflow for semiconductor wafer-sort yield improvement — from root-cause investigation through experiment design to statistical verification.

Overview

Integrated circuits are manufactured on semiconductor wafers, where each die undergoes electrical tests (wafer sort) to determine if it passes for shipment. This project analyzes a synthetic wafer-sort dataset to:

  1. Identify yield-loss drivers using yield heatmaps, Pareto analysis, and spatial wafer maps
  2. Investigate root causes through parametric distributions, box plots, and correlation analysis
  3. Design and evaluate a process-improvement experiment with multiple process splits
  4. Statistically verify improvements using Welch's two-sample t-test

Techniques & Tools

Analysis Step Tools
Data generation & wrangling numpy, pandas (groupby, pivot, melt, conditional logic)
Yield-loss breakdown Per-test pass/fail computation, aggregation by wafer/category
Failure-bin Pareto First-fail identification, sorted frequency analysis
Box plots with spec limits matplotlib boxplot, limit-line overlays
Wafer-map spatial analysis 2D scatter plots with colormapped parametric values
Parametric correlation Pearson correlation matrix, seaborn heatmap
Multi-process comparison Color-coded grouped visualizations
Hypothesis testing scipy.stats.ttest_ind (Welch's t-test, α = 0.05)

Key Results

  • Root cause: T01_RES (resistance) failures concentrated at wafer edges due to center-to-edge process non-uniformity; T03_IOFF (leakage) failures randomly distributed
  • Best process: A1 (higher temperature) reduced radial non-uniformity, improving yield from ~57% to ~79%
  • Statistical verification: Welch's t-test confirmed significant improvement in T01_RES and overall yield (p < 0.001) with no degradation of other parameters

Requirements

numpy
pandas
matplotlib
seaborn
scipy

Usage

pip install numpy pandas matplotlib seaborn scipy
jupyter notebook semiconductor_yield_analysis.ipynb

Project Structure

├── semiconductor_yield_analysis.ipynb    # Main analysis notebook
├── README.md
└── requirements.txt

Acknowledgments

Inspired by Seshadri Kolluri's R-based semiconductor data analysis example, reimplemented in Python with additional parametric correlation analysis and enhanced visualizations.

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Python-based semiconductor wafer-sort yield analysis using statistical comparison, DOE-style process evaluation, and visualization.

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